Circuit and method to measure simulation to silicon timing correlation

An integrated circuit, comprising:

• a first circuit, comprising:
• a programmable ring oscillator comprising a first programmable delay path, the programmable ring oscillator being configured to propagate a first oscillator signal and a second oscillator signal along the first programmable delay path;
• and
• a controller configured to determine a central tendency of propagation delay of the programmable ring oscillator using the first and second oscillator signals,
• wherein the first programmable delay path comprises a plurality of oscillator stages, oscillator stages of the plurality of oscillator stages being switchable into and out of the first programmable delay path based on a first plurality of respective control signals;
• and
• a second circuit, comprising:
• a second programmable delay path comprising a plurality of path delay tuners configured to:
• receive a second plurality of control signals;
• and
• add to the second programmable delay path an amount of cell delay and an amount of wire delay that are based on the second plurality of control signals;
• and
• a controller configured to provide the second plurality of control signals to the programmable delay path, receive a signal from the second programmable delay path, and compare the signal to a reference signal.