Testing method and testing system

A testing system, comprising:

• a signal generator configured to generate a multi-tone signal and transmit the multi-tone signal to an input terminal of an under-test device, wherein the multi-tone signal comprises a plurality of components with a plurality of frequencies;
• a spectrum analyzer coupled to the under-test device and configured to measure the input terminal of the under-test device and an output terminal of the under-test device to acquire a plurality of input ripple intensities corresponding to the frequencies and acquire a plurality of output ripple intensities corresponding to the frequencies;
• a control device coupled to the spectrum analyzer and configured to generate a plurality of power supply rejection ratios corresponding to the frequencies according to the input ripple intensities and the output ripple intensities;
• and
• a switching device,
• wherein the control device is configured to control the switching device to couple the spectrum analyzer to the input terminal, and the spectrum analyzer measures the input terminal to acquire the input ripple intensities corresponding to the frequencies, wherein after the spectrum analyzer acquires the input ripple intensities, the control device is further configured to control the switching device to couple the spectrum analyzer to the output terminal, and the spectrum analyzer measures the output terminal to acquire the output ripple intensities corresponding to the frequencies.

A testing system, comprising:

• a signal generator configured to generate a multi-tone signal and transmit the multi-tone signal to an input terminal of an under-test device, wherein the multi-tone signal comprises a plurality of components with a plurality of frequencies;
• a spectrum analyzer coupled to the under-test device and configured to measure the input terminal of the under-test device and an output terminal of the under-test device to acquire a plurality of input ripple intensities corresponding to the frequencies and acquire a plurality of output ripple intensities corresponding to the frequencies;
• a control device coupled to the spectrum analyzer and configured to generate a plurality of power supply rejection ratios corresponding to the frequencies according to the input ripple intensities and the output ripple intensities;
• and
• a switching device,
• wherein the control device is configured to control the switching device to couple the spectrum analyzer to the output terminal, and the spectrum analyzer measures the output terminal to acquire the output ripple intensities corresponding to the frequencies,
• wherein after the spectrum analyzer acquires the output ripple intensities, the control device is further configured to control the switching device to couple the spectrum analyzer to the input terminal, and the spectrum analyzer measures the input terminal to acquire the input ripple intensities corresponding to the frequencies.