Electronic device having a testing method for determining defects in a sensor layer

A method for testing an electronic device, the method comprising:

• providing the electronic device including a display layer and a sensor layer on the display layer and configured to operate at a touch drive frequency, the sensor layer including a plurality of first electrodes and a plurality of second electrodes insulatively intersecting the plurality of first electrodes;
• providing a test signal having a test frequency higher than the touch drive frequency to the plurality of first electrodes;
• measuring mutual capacitance with the plurality of first electrodes through the plurality of second electrodes;
• and
• determining whether or not the sensor layer is defective, based on the mutual capacitance,
• wherein the providing the test signal includes:
• providing the test signal to one first electrode among the plurality of first electrodes;
• and
• providing the test signal to an other first electrode among the plurality of first electrodes,
• wherein the measuring the mutual capacitance includes:
• measuring a first mutual capacitance with the one first electrode among the plurality of first electrodes through the plurality of second electrodes;
• and
• measuring a second mutual capacitance with the other first electrode among the plurality of first electrodes through the plurality of second electrodes, and
• wherein determining whether or not the sensor layer is defective includes determining that the one first electrode among the plurality of first electrodes is open-circuited, based on the first mutual capacitance and the second mutual capacitance differing from each other.

A method for testing an electronic device, the method comprising:

• providing the electronic device including a display layer and a sensor layer on the display layer and configured to operate at a touch drive frequency, the sensor layer including a plurality of first electrodes and a plurality of second electrodes insulatively intersecting the plurality of first electrodes;
• providing a test signal having a test frequency higher than the touch drive frequency to the plurality of first electrodes;
• measuring mutual capacitance with the plurality of first electrodes through the plurality of second electrodes;
• and
• determining whether or not the sensor layer is defective, based on the mutual capacitance,
• wherein the measuring the mutual capacitance includes:
• measuring a first mutual capacitance of one first electrode among the plurality of first electrodes;
• and
• measuring a second mutual capacitance of another adjacent first electrode among the plurality of first electrodes, and
• wherein the determining whether or not the sensor layer is defective includes determining that the sensor layer is defective, based on a percentage of a value obtained by dividing a difference between the first mutual capacitance and the second mutual capacitance by the second mutual capacitance being 20% or more.

An electronic device comprising:

• a display layer;
• a sensor layer on the display layer and configured to operate at a touch drive frequency, the sensor layer including a plurality of first electrodes and a plurality of second electrodes insulatively intersecting the plurality of first electrodes;
• and
• a controller configured to control the sensor layer,
• wherein the controller is configured to provide a test signal having a test frequency higher than the touch drive frequency to the plurality of first electrodes, to measure a first mutual capacitance from one second electrode among the plurality of second electrodes, to measure a second mutual capacitance from another second electrode among the plurality of second electrodes, and to determine whether or not the sensor layer is defective, by comparing the first mutual capacitance and the second mutual capacitance.