Adaptive flexible chip test socket and formation method thereof
AssigneeSemight Instruments Co., Ltd
InventorsZhe Lian, Jianjun Huang, Yonghong Wu, Shan Zhao, Haiyang Hu
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AssigneeSemight Instruments Co., Ltd
InventorsZhe Lian, Jianjun Huang, Yonghong Wu, Shan Zhao, Haiyang Hu
Estimating the term…
The present disclosure includes an adaptive die test socket and a formation method. The die test socket includes an upper test socket and a lower test socket disposed directly below the upper test socket. The upper test socket is connected to a support frame; a strip-shaped through hole is formed on an upper surface of the support frame; a first protruding strip is at each of lower portions of two opposite inner walls of the strip-shaped through hole; a corresponding second protruding strip is at each of upper portions of two opposite side surfaces of the installation plate; and a side of a strip-shaped block is fixedly connected to the upper surface of the support frame, and another side of the strip-shaped block extends to directly above the second protruding strip and is connected to the second protruding strip through at least two springs.
An adaptive die test socket, comprising:
Dependencies are inferred from the claim text.