US 12,216,064 B2Granted

Inspection device

AssigneeFuji Corporation

InventorsTomoya Fujimoto, Takahiro Kobayashi, Yuki Inaura

Life of this patent

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Abstract

An inspection device is such that the inspection device executes a mounting inspection of a component using an inspection image of a board on which the component is mounted and includes an imaging device and an image processing device. The imaging device obtains three monochromatic images of the board in R, G, B. The image processing device sets a board color using brightness values of the three monochromatic images obtained by the imaging device, calculates complementary colors of the board color so set, determines on a color component having a largest brightness value in individual color components of the complementary colors so calculated, and sets the monochromatic image having the color component so determined in the obtained three monochromatic images as the inspection image.

Claims3

Dependent claims

An inspection device for executing a mounting inspection of a component using an inspection image of a board on which the component is mounted, comprising:

an imaging device configured to obtain three monochromatic images of the board in red, green, and blue;
and
an image processing device configured to
analyze each of the monochromatic images and count occurrences of brightness values 0 to 255;
determine a board color R, G, B based on a highest count of the occurrences of the brightness values of the three monochromatic images,
determine a complementary color R′, G′, B′ of the board based on a highest brightness value among the board color R, G, B, and a lowest brightness value among the board color R, G, B, and,
determine a color component as having a largest brightness value in the complementary color R′, G′, B′, and
select a monochromatic image of the three monochromatic images corresponding to the color component as the inspection image.

5 more elements

Dependencies are inferred from the claim text.

Facts

Application: 17/629,757Filed 26 Jul 2019
Published: US 2022/0252524 A111 Aug 2022
Granted: 4 Feb 2025
Term ends: Not estimatedThe source records don’t support an estimate.

Classification11 codes

G01N 21/95
Investigating the presence of flaws or contamination: characterised by the material or shape of the object to be examined
H05K 13/0812
Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling…
G01N 21/8851
Investigating the presence of flaws or contamination: scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment,…
G01N 21/95684
Inspecting patterns on the surface of objects: patterns showing highly reflecting parts, e.g. metallic elements

Family

US 2022/0252524 A1Pre-grant publication · published 11 Aug 2022
US 12,216,064 B2This patent

From the US filing history. Foreign family members aren’t listed.

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