Devices and methods for determining chiral optical properties from third harmonic Mie scattering of semiconductor nanohelices

Abstract

Methods and devices for detecting chiral properties from a sample are provided. Light may be directed towards a sample in contact with a chiral nanoparticle. Third harmonic Mie scattering (THMS) optical activity generated by the chiral nanoparticle in contact with the sample can then be detected. A device for detecting chiral properties of a sample is also contemplated that includes Nat least one microwell having a volume of ≤about 1 microliter configured to hold a chiral nanoparticle capable of generating third harmonic Mie scattering (THMS) optical activity and a sample to be analyzed. The device includes a source of light configured to generate and direct light toward the at least one microwell containing the chiral nanoparticle and the sample and at least one detector configured to detect third harmonic Mie scattering (THMS) generated by the chiral nanoparticle in the microwell.

Dependencies are inferred from the claim text.