Adjustable cross-sectional area sample container

A method of sample observation comprising:

• providing a sample enclosure having a base and one or more sidewalls extending from the base;
• introducing a particle suspension into the sample enclosure;
• performing sample observation on the particle suspension within the enclosure;
• and
• adjusting a cross-sectional area of the sample enclosure with the particle suspension therein, wherein the cross-sectional area is substantially uniform with respect to an axis extending from the base of the sample enclosure.

A method of sample observation comprising:

• providing a sample enclosure having a base and one or more sidewalls extending from the base;
• introducing a particle suspension into the sample enclosure;
• performing a sample observation on the particle suspension within the enclosure from among the group of sedimentation photographical capturing, dynamic light scattering, light transmittance and absorbance, zeta potential analysis, 3-ω approach, scanning electron microscopy analysis, transmitted electron microscopy characterization, spectral analysis, centrifugation, and particles size analysis;
• adjusting a cross sectional area of the sample enclosure with the particle suspension therein, wherein the cross-sectional area of the sample enclosure is substantially uniform with respect to an axis perpendicular to the base of the sample enclosure;
• and
• repeating the sample observation previously performed on the sample enclosure of adjusted, substantially uniform cross-sectional area.