Image data inspection method and apparatus, computer device, and storage medium
AssigneeTencent Technology (Shenzhen) Company Limited
InventorsShilei Cao, Hualuo Liu, Yefeng Zheng
Life of this patent
Estimating the term…
Loading patent…
AssigneeTencent Technology (Shenzhen) Company Limited
InventorsShilei Cao, Hualuo Liu, Yefeng Zheng
Estimating the term…
This application relates to an image data inspection method and apparatus in the field of artificial intelligence (AI) technologies. The method includes obtaining an image to be inspected, the image to be inspected comprising a sequence of slice images; determining a corresponding group of slice images for each target image in the sequence of slice images; extracting a corresponding slice feature map for each slice image in the group of slice images; aligning the slice feature maps extracted corresponding to the group of slice images; aggregating context information of each slice image in the group of slice images by using an aligned feature map; and performing target region inspection on an aggregated feature map, to obtain an inspection result corresponding to the target image, and combining the inspection result corresponding to each target image, to generate an inspection result corresponding to the image to be inspected.
An image data inspection method, performed by a computer, the method comprising:
One or more non-transitory storage media storing computer-readable instructions, the computer-readable instructions, when executed by one or more processors, causing the one or more processors to perform:
An image data inspection apparatus, comprising a memory and a processor coupled to the memory, the processor being configured to perform:
Dependencies are inferred from the claim text.