Multi-bit voltage-to-delay conversion in data converter circuitry
AssigneeTexas Instruments Incorporated
InventorsSai Aditya Nurani, Rishi Soundararajan, Nithin Gopinath, Visvesvaraya Pentakota, Shagun Dusad
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AssigneeTexas Instruments Incorporated
InventorsSai Aditya Nurani, Rishi Soundararajan, Nithin Gopinath, Visvesvaraya Pentakota, Shagun Dusad
Estimating the term…
An analog-to-digital converter circuit incorporating includes a multi-bit input buffer having a differential input and configured to generate, at a plurality of differential outputs, a plurality of residues of a differential input sample relative to a corresponding plurality of zero-crossing references. Chopping stages chop the residues, for example with a pseudo-random binary sequence. The circuit further includes zero-crossing comparators, each with differential inputs coupled to receive one of the chopped residues. The zero-crossing comparators are in an ordered sequence of zone thresholds within the input range of the circuit. Folding logic circuitry has inputs coupled to outputs of the comparators, and outputs a delay domain signal indicating a magnitude of the one of the residues relative to a nearest zone threshold. Digital stage circuitry generates a digital output word representing the received input sample responsive to the comparator outputs and the delay domain signal.
An analog-to-digital converter circuit, comprising:
A method of converting an analog signal level to a digital word, comprising the steps of:
A voltage-to-delay conversion circuit, comprising:
An analog-to-digital converter having an analog input adapted to receive an analog input signal and having an output adapted to output a digital signal including most-significant bits (MSBs) and least-significant bits (LSBs), the analog-to-digital converter comprising:
Dependencies are inferred from the claim text.