Semiconductor device
AssigneeFuji Electric Co., Ltd.
InventorsKota Ohi, Yoshihiro Ikura, Yosuke Sakurai, Mutsumi Kitamura, Yuichi Onozawa, Yoshiharu Kato, Toru Ajiki
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AssigneeFuji Electric Co., Ltd.
InventorsKota Ohi, Yoshihiro Ikura, Yosuke Sakurai, Mutsumi Kitamura, Yuichi Onozawa, Yoshiharu Kato, Toru Ajiki
Estimating the term…
Provided is a semiconductor device, including: a drift region of a first conductivity type which is provided in a semiconductor substrate, and a buffer region of the first conductivity type which is provided between the drift region and a lower surface of the semiconductor substrate, and has three or more concentration peaks higher than a doping concentration of the drift region of the semiconductor substrate in a depth direction. Three or more of the concentration peaks includes a shallowest peak closest to the lower surface of the semiconductor substrate, a high concentration peak arranged at an upper side than the lower surface of the semiconductor substrate than the shallowest peak, and one or more low concentration peaks arranged at an upper side than the lower surface of the semiconductor substrate than the high concentration peak and of which the doping concentration is ⅕ or less of the high concentration peak.
A semiconductor device, comprising:
Dependencies are inferred from the claim text.