US 12,191,130 B2Granted

Charge detection mass spectrometry

AssigneeMicromass UK Limited

InventorsKeith Richardson, Jeffery Mark Brown, David J. Langridge

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Abstract

Disclosed herein are various methods and apparatus for performing charge detection mass spectrometry (CDMS). In particular, techniques are disclosed for monitoring a detector signal from a CDMS device to determine how many ions are present in the ion trap (10) of the CDMS device. For example, if no ions are present the measurement can then be terminated early. Similarly, if more than one ion is present, the measurement can be terminated early, or ions can be removed from the trap (10) until only a single ion remains. Techniques are also provided for increasing the probability of there being a single ion in the trap (10). A technique for attenuating an ion beam is also provided.

Claims20

Dependent claims

An ion beam attenuating apparatus comprising:

a first ion beam attenuator that is operable in either a high ion transmission mode or a low ion transmission mode in order to selectively attenuate an ion beam, wherein the output of the first ion beam attenuator is passed through a first gas-filled region;
a second ion beam attenuator that is operable in either a high ion transmission mode or a low ion transmission mode in order to selectively attenuate an ion beam;
and
control circuitry that is configured to:
repeatedly switch the first ion beam attenuator between the high and low ion transmission modes to generate a first non-continuous ion beam at the output of the first ion beam attenuator, wherein the first non-continuous ion beam is passed through the gas-filled region and converted into a substantially continuous ion beam thereby before arriving at the second ion beam attenuator;
and
repeatedly switch the second ion beam attenuator between the high and low ion transmission modes to generate a second non-continuous ion beam at the output of the second ion beam attenuator.

4 more elements

Dependencies are inferred from the claim text.

Facts

Application: 18/495,237Filed 26 Oct 2023 · continuation
Priority: GB 180291722 Feb 2018
Published: US 2024/0063008 A122 Feb 2024
Granted: 7 Jan 2025
Term ends: Not estimatedThe source records don’t support an estimate.

Classification5 codes

H01J 49/0036
Methods for using particle spectrometers: step by step routines describing the handling of the data generated during a measurement
H01J 49/027
Detectors specially adapted to particle spectrometers: detecting image current induced by the movement of charged particles
H01J 49/067
Electron- or ion-optical arrangements: ion lenses, apertures, skimmers
H01J 49/4265
Methods for controlling ions: controlling the number of trapped ions; preventing space charge effects

Family

PCT/GB2019/050494Parent of this continuation · filed 22 Feb 2019
Application17/745,513Parent of this continuation · filed 16 May 2022
US 11,367,602 B2Parent of this continuation · filed 21 Jun 2022
US 2024/0063008 A1Pre-grant publication · published 22 Feb 2024
US 11,837,452 B2Parent of this continuation
Application16/971,958Parent of this continuation
US 2020/0395202 A1Published application
US 2022/0359177 A1Published application
US 12,191,130 B2This patent

From the US filing history. Foreign family members aren’t listed.

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