Managing memory leakages of a system for evaluating manufactured items

A method for managing memory leakages of a system for evaluating manufactured items, the method comprising:

• selecting, by a memory leakage unit, a first feature out of a group of features applied by an evaluation unit while executing instructions related to the evaluating of the manufactured items, the evaluation unit belongs to the system for evaluating manufactured items;
• wherein the first feature has a priority that is lower than a priority of a second feature of the group of features;
• wherein priorities of features of the group of features are determined based on (i) priority information provided by one or more developers of the instructions related to the evaluating of the manufactured item, and (ii) usage information indicative of usage of the features of the group of features by the evaluation unit;
• and
• disabling an execution, by the evaluation unit, of instructions associated with the first feature at a presence of a memory leakage event.

A non-transitory computer readable medium for managing memory leakages of a system for evaluating manufactured items, the non-transitory computer readable medium stores instructions that once executed by a memory leakage unit, causes the memory leakage unit to:

• select a first feature out of a group of features applied by an evaluation unit while executing instructions related to the evaluating of the manufactured items, the evaluation unit belongs to the system for evaluating manufactured items;
• wherein the first feature has a priority that is lower than a priority of a second feature of the group of features;
• wherein priorities of features of the group of features are determined based on (i) priority information provided by one or more developers of the instructions related to the evaluating of the manufactured item, and (ii) usage information indicative of usage of the features of the group of features by the evaluation unit;
• and
• disable an execution, by the evaluation unit, of instructions associated with the first feature at a presence of a memory leakage event.