Dummy device for core device to operate in a safe operating area and method for manufacturing the same

A semiconductor device for enabling a core devices to operate in a safe operating area, comprising:

• a substrate;
• a continuous active region on the substrate;
• a core transistor of the core device having a drain configured to receive a first voltage;
• a first dummy device connected to the drain of the core transistor, the first dummy device having a first dummy transistor and a second dummy transistor, wherein
• a drain of the second dummy transistor is connected to the source of the first dummy transistor, and
• a source of the second dummy transistor is disposed adjacent to an edge of the continuous active region;
• and
• a second dummy device connected between the first dummy device and the core transistor, wherein the second dummy device comprises a third dummy transistor, and wherein a gate, a source and a drain of the third dummy transistor are connected together.

A semiconductor device for enabling a core devices to operate in a safe operating area, comprising:

• a core transistor of the core device having a drain configured to receive a first voltage;
• a first dummy device connected to the drain of the core transistor, the first dummy device having a first dummy transistor and a second dummy transistor, wherein
• a drain of the first dummy transistor is coupled to the drain of the core transistor,
• a gate and a source of the first dummy transistor are connected to each other,
• a drain of the second dummy transistor is connected to the source of the first dummy transistor, and
• a gate and a source of the second dummy transistor are connected to each other;
• and
• a second dummy device connected between the first dummy device and the core transistor, wherein the second dummy device comprises a third dummy transistor, and wherein a gate, a source and a drain of the third dummy transistor are connected together.