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US 12,183,707 B2Granted
Packaged semiconductor device having improved reliability and inspectionability and manufacturing method thereof
AssigneeSTMicroelectronics S.r.l.
InventorAgatino Minotti
Life of this patent
Estimating the term…
Abstract
Packaged device having a carrying base; an accommodation cavity in the carrying base; a semiconductor die in the accommodation cavity, the semiconductor die having die pads; a protective layer, covering the semiconductor die and the carrying base; first vias in the protective layer, at the die pads; and connection terminals of conductive material. The connection terminals have first connection portions in the first vias, in electrical contact with the die pads, and second connection portions, extending on the protective layer, along a side surface of the packaged device.
Claims20
A packaged device, comprising:
- a front surface, a back surface opposite to the front surface, and one or more side surfaces extending between the front surface and the back surface;
- a carrying base including delimitation walls and including one or more first sidewalls partially defining the one or more side surfaces;
- an accommodation cavity in the carrying base and delimited by the delimitation walls;
- a semiconductor die in the accommodation cavity;
- a protective layer covering the semiconductor die and the carrying base, the protective layer including protrusions on the delimitation walls, the protective layer including one or more second sidewalls partially defining the one or more side surfaces, the one or more second sidewalls are coplanar with the one or more first sidewalls;
- first via grooves in the protective layer, the first via grooves extend to the delimitation walls, and the first via grooves are at least partially delimited by the protrusions;
- and
- side connection grooves are on opposite sides of the protrusions relative to the first via grooves, the side connection grooves extend from the protrusions to the one or more side surfaces;
- first connection terminals of conductive material, the first connection terminals having first connection portions in the first via grooves in electrical contact with the delimitation walls, second connection portions extending on the protective layer and coupled to the first connection portions, and third connection portions extending along the one or more side surfaces and coupled to the second connection portions, the third portions of the first connection terminals of conductive material include one or more third sidewalls defining the one or more sidewalls, the one or more third sidewalls are coplanar with the one or more first sidewalls and the one or more second sidewalls;
- and
- conductive outer connection layers on the second connection portions and the third connection portions of the first connection terminals of conductive material, the conductive outer connection layers including one or more end surfaces coplanar with the one or more first sidewalls, the one or more end surfaces partially define the one or more side surfaces, and the one or more end surfaces coplanar with the one or more first sidewalls, the one or more second sidewalls, and the one or more third sidewalls.
8 more elements
An electronic device, comprising:
- a packaged device including:
- a front surface, a back surface opposite to the front surface, and one or more side surfaces extending between the front surface and the back surface;
- a carrying base including delimitation walls;
- an accommodation cavity in the carrying base and delimited by the delimitation walls;
- a semiconductor die in the accommodation cavity, the semiconductor die having die pads;
- a protective layer covering the semiconductor die and the carrying base, the protective layer including protrusions on the delimitation walls;
- first via grooves in the protective layer, the first via grooves overlap and extend to the die pads;
- and
- second via grooves in the protective layer spaced outward from the first via grooves, the second via grooves extend to the delimitation walls;
- side connection grooves are on opposite sides of the protrusions relative to the second via grooves, the side connection grooves extend from the protrusions to the one or more side surfaces;
- first connection terminals of conductive material, the first connection terminals having first connection portions in the first via grooves and in electrical contact with the die pads, and second connection portions extending on the protective layer;
- second connection terminals of conductive material, the second connection terminals having third connection portions in the second via grooves and in electrical contact with the delimitations walls, fourth connection portions within the side connection grooves and exposed at the one or more side surfaces, and fifth connection portions extending on the protective layer from the first connection portions to the second connection portions, respectively;
- a support having conductive contact regions facing the first connection terminals and the second connection terminals;
- and
- adhesive regions between the conductive contact regions and the front surface, the adhesive regions are in electrical contact with the conductive contact regions, the first connection terminals, and the second connection terminals, and the adhesive regions further extending along the one or more side surfaces and in contact with the fourth connection portions of the second connection terminals.
12 more elements
A packaged device, comprising:
- a first surface, a second surface opposite to the first surface, a first side surface extending between the first surface and the second surface, and a second side surface extending between the first surface and the second surface, the second side surface being opposite to the first side surface, and the first and second side surfaces being transverse to the first surface and transverse to the second surface;
- a carrying base including:
- an accommodation cavity within the carrying base;
- a first projection on a first side of the accommodation cavity, the first projection at least partially delimits the accommodation cavity;
- a second projection on a second side of the accommodation cavity opposite to the first side of the accommodation cavity, the second projection at least partially delimits the accommodation cavity;
- and
- a first external sidewall and a second external sidewall opposite to the first external sidewall;
- a semiconductor die in the accommodation cavity, the semiconductor die including at least one die pad, the semiconductor die fills a first portion of the accommodation cavity;
- a protective layer covers the projections of the carrying base, covers the semiconductor die, and fills a second portion of the accommodation cavity, the protective layer further includes:
- a first protrusion on the first projection that delimits a first via groove in the protective layer that overlaps the first projection, and a first connection groove on an opposite side of the first protrusion relative to the first via groove, the first connection groove extends from the first protrusion to the side surface;
- a second protrusion on the second projection that delimits a second via groove in the protective layer, the second via groove overlaps the second projection, and a second connection groove on an opposite side of the second protrusion relative to the second via groove, the second connection groove extends from the second protrusion to the side surface;
- a third via groove extends to the at least one die pad;
- and
- a third external sidewall and fourth external sidewall opposite to the third external sidewall, the third external sidewall is coplanar with the first external sidewall, and the fourth external sidewall is coplanar with the second external sidewall;
- a first connection region having a first via extending through the protective layer to the first projection, the first via coupled to the first projection, and the first via within the first via groove, the first connection region including a first vertical portion within the first connection groove and a first surface portion that extends along the protective layer from the first via to the first vertical portion;
- a second connection region having a second via extending through the protective layer to the second projection, the second via coupled to the second projection, and the second via within the second via groove, the second connection region including a second vertical portion within the second connection groove and a second surface portion that extends along the protective layer from the second via to the second vertical portion;
- a third connection region having a third via extending through the protective layer to the at least one die pad, the third via coupled to the at least one die pad, and the third via within the third via groove, and the third connection region being between the first and second outer connection regions;
- an insulating layer on the protective layer;
- a first conductive outer connection layer on the first vertical portion and on the first surface portion, the first conductive outer connection layer having a first end surface coplanar with first sidewall and third sidewall, and the first conductive outer connection layer is exposed from the insulating layer;
- and
- a second conductive outer connection layer on the second vertical portion and on the second surface portion, the second conductive outer connection layer having a second end surface coplanar with second sidewall and the fourth sidewall, and the second conductive outer connection layer is exposed from the insulating layer.
18 more elements
Dependencies are inferred from the claim text.