In-situ semiconductor processing chamber temperature apparatus
AssigneeApplied Materials, Inc.
InventorsAndrew Nguyen, Yogananda Sarode, Xue Chang, Kartik Ramaswamy
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AssigneeApplied Materials, Inc.
InventorsAndrew Nguyen, Yogananda Sarode, Xue Chang, Kartik Ramaswamy
Estimating the term…
Methods and systems for in-situ temperature control are provided. The method includes delivering a temperature-sensing disc into a processing region of a processing chamber without breaking vacuum. The temperature-sensing disc includes one or more cameras configured to perform IR-based imaging. The method further includes measuring a temperature of at least one region of at least one chamber surface in the processing region of the processing chamber by imaging the at least one surface using the temperature-sensing disc. The method further includes comparing the measured temperature to a desired temperature to determine a temperature difference. The method further includes adjusting a temperature of the at least one chamber surface to compensate for the temperature difference.
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Dependencies are inferred from the claim text.