Systems and methods for multi-signal fault analysis

A system comprising:

• at least one processor;
• and
• one or more computer-readable media storing instructions that, when executed by the at least one processor, cause the system to perform operations comprising:
• receiving a test request from a first device, the test request describing a problem with a test object;
• identifying test design information based on the problem with the test object;
• transmitting the test design information to the first device;
• receiving an indication, from the first device, that a collection system for performing a multi-signal fault analysis test session is configured based on the test design information, the collection system including at least the first device and a second device;
• performing the multi-signal fault analysis test session for the test object based on a first signal collected by the first device via a test object component and a second signal representing a physical phenomenon sensed by the second device;
• and
• analyzing the first signal and the second signal to diagnose the problem with the test object.

A non-transitory machine-readable medium storing instructions that, when executed by one or more processors of a machine, cause the machine to perform operations comprising:

• receiving a test request from a first device, the test request describing a problem with a test object;
• identifying test design information based on the problem with the test object;
• transmitting the test design information to the first device;
• receiving an indication, from the first device, that a collection system for performing a multi-signal fault analysis test session is configured based on the test design information, the collection system including at least the first device and a second device;
• performing the multi-signal fault analysis test session for the test object based on a first signal collected by the first device via a test object component and a second signal representing a physical phenomenon sensed by the second device;
• and
• analyzing the first signal and the second signal to diagnose the problem with the test object.