Scanners to characterize and distinguish anomalies based on multiple mode scans
OwnerJohn Fortune, Brian Lewis +1inventors
InventorsJohn Fortune, Brian Lewis, Michelle Weinberger
Life of this patent
Estimating the term…
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OwnerJohn Fortune, Brian Lewis +1inventors
InventorsJohn Fortune, Brian Lewis, Michelle Weinberger
Estimating the term…
An example method to characterize an anomaly includes obtaining information about an item using a first mode scan and detecting whether the item contains an anomaly based on the information. The method further includes determining, responsive to detecting the anomaly, an area of interest of the item corresponding to a location of the anomaly, and determining a strategy including a procedure to obtain other information of the area of interest. The method refines a characterization of the anomaly based on the other information, and compares the characterization of the anomaly to a predetermined criterion. The method iteratively revises the strategy to perform additional available procedures, to further refine the characterization of the anomaly. When the characterization of the anomaly meets the predetermined criterion corresponding to a prohibited item, the method identifies the anomaly as prohibited.
A method to characterize an anomaly, comprising:
A method to characterize an anomaly, comprising:
An apparatus comprising:
An apparatus comprising:
An apparatus comprising:
Dependencies are inferred from the claim text.