Processing device, measurement device, and measurement method
AssigneeKabushiki Kaisha Toshiba
InventorsKiminori Toya, Hiroshi Ohno
Life of this patent
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AssigneeKabushiki Kaisha Toshiba
InventorsKiminori Toya, Hiroshi Ohno
Estimating the term…
According to one embodiment, a processing device includes an acquisition part, and a processor. The acquisition part and the processor are configured to perform a first operation. The acquisition part is configured to acquire first image data, second image data, and third image data in the first operation. The first image data includes data related to a first object member image of an object member transmitting a first light. The second image data includes data related to a second object member image of the object member transmitting a second light. The third image data includes data related to a third object member image of the object member transmitting a third light. The processor is configured to derive first derived data based on the first, second, and third image data in the first operation.
A processing device, comprising:
A processing device, comprising:
A processing device, comprising:
A measurement method comprising:
A measurement method comprising:
Dependencies are inferred from the claim text.