Utilize machine learning in selecting high quality averaged SEM images from raw images automatically
AssigneeASML Netherlands B.V.
InventorsChen Zhang, Qiang Zhang, Jen-Shiang Wang, Jiao Liang
Life of this patent
Estimating the term…
Loading patent…
AssigneeASML Netherlands B.V.
InventorsChen Zhang, Qiang Zhang, Jen-Shiang Wang, Jiao Liang
Estimating the term…
A method for evaluating images of a printed pattern. The method includes obtaining a first averaged image of the printed pattern, where the first averaged image is generated by averaging raw images of the printed pattern. The method also includes identifying one or more features of the first averaged image. The method further includes evaluating the first averaged image, using an image quality classification model and based at least on the one or more features. The evaluating includes determining, by the image quality classification model, whether the first averaged image satisfies a metric.
A method comprising:
A computer program product comprising a non-transitory computer readable medium having instructions therein, the instructions, when executed by a computer system, configured to cause the computer system to at least:
Dependencies are inferred from the claim text.