Method, arrangement, and computer program product for organizing the excitation of processing paths for testing a microelectric circuit

A microelectronic circuit, comprising:

• a processing unit that comprises processing paths, wherein the processing unit is configured to,
• determine, based on at least one or more pieces of input information, whether one or more of said processing paths of the microelectronic circuit are to be excited with test signals;
• and
• in response to a determination that said one or more processing paths of the microelectronic circuit are to be excited with said test signals, proceed to excite said one or more of said processing paths with said test signals and monitoring whether timing events occur on such one or more excited processing paths;
• wherein a timing event is a change in a digital value at an input of a respective register circuit on an excited processing path, which change took place later than an allowable time limit defined by a triggering signal to said respective register circuit.

A non-transitory computer-readable medium comprising instructions that are executable by a processor to perform operations comprising:

• determining, within a microelectronic circuit based on at least one or more inputs, whether one or more of processing paths of the microelectronic circuit are to be excited with test signals, and
• in response to determining that said one or more processing paths of the microelectronic circuit are to be excited with said test signals,
• proceeding to excite said one or more of said processing paths with said test signals;
• and
• monitoring whether timing events occur on such one or more excited processing paths;
• wherein a timing event is a change in a digital value at an input of a respective register circuit on an excited processing path, which change took place later than an allowable time limit defined by a triggering signal to said respective register circuit.