Abnormality detection circuit, semiconductor device, electronic apparatus, and vehicle

An abnormality detection circuit comprising:

• a first current source configured to generate a first current flowing from an external terminal toward a reference potential terminal;
• a second current source configured to generate a second current flowing from a power supply potential terminal toward the external terminal;
• a comparator configured to generate an abnormality detection signal by comparing a detection voltage corresponding to an application voltage of the external terminal with a predetermined threshold voltage;
• a first switch configured to electrically connect and disconnect between the first current source and the external terminal;
• a second switch configured to electrically connect and disconnect between the second current source and the external terminal;
• and
• a controller configured to switch between a first abnormality detection mode in which an operation of generating the first current is performed and a second abnormality detection mode in which an operation of generating the second current is performed,
• wherein the controller is further configured to turn the first switch on and turn the second switch off in the first abnormality detection mode, and turn the first switch off and turn the second switch on in the second abnormality detection mode.