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US 12,181,571 B2Granted
Altimeter testing device and methods
AssigneeViavi Solutions Inc.
InventorRock Crawford
Life of this patent
Estimating the term…
Abstract
Devices and methods for testing altimeters are provided. A radio-frequency (RF) signal may be received from an altimeter and passed through an RF delay module to delay the RF signal. The delayed RF signal may be converted to an optical signal, which may be passed through an optical delay module to delay the optical signal. The system tests the accuracy of the altimeter based on the combined RF signal delay and optical signal delay.
Claims20
A method of testing an altimeter, the method comprising:
- receiving a radio-frequency (RF) signal from the altimeter;
- passing the received RF signal through at least one delay module to delay the RF signal by a delay corresponding to a test altitude comprising a first altitude and a second altitude larger than the first altitude, wherein the delay comprises an RF delay that corresponds to the first altitude and an optical delay that corresponds to the second altitude;
- and
- transmitting the delayed RF signal to the altimeter.
1 more element
A device for testing an altimeter, comprising:
- an input to receive a radio-frequency (RF) signal from the altimeter;
- at least one delay module to delay the RF signal by a delay corresponding to a test altitude comprising a first altitude and a second altitude larger than the first altitude, wherein the delay comprises an RF delay that corresponds to the first altitude and an optical delay that corresponds to the second altitude;
- and
- an output for transmitting the delayed RF signal to the altimeter.
1 more element
Dependencies are inferred from the claim text.