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US 12,181,517 B2Granted
Method for detecting memory chip
AssigneeNanya Technology Corporation
InventorsYan-De Lin, Jui-Hsiu Jao
Life of this patent
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Abstract
A method for detecting a memory chip includes the following steps coupling a detecting circuit to a first area and a second area of the memory chip, the second area is not overlapped with the first area; inputting a first detecting signal from the detecting circuit to the first area of the memory chip; burning out a cell of the detecting circuit; and inputting a second detecting signal from the detecting circuit to the second area of the memory chip.
Claims7
A method for detecting a memory chip, comprising:
- coupling a detecting circuit to a first area and a second area of the memory chip, wherein the second area is not overlapped with the first area;
- inputting a first detecting signal from the detecting circuit to the first area of the memory chip;
- burning out a cell of the detecting circuit;
- and
- inputting a second detecting signal from the detecting circuit to the second area of the memory chip.
2 more elements
Dependencies are inferred from the claim text.