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US 12,181,516 B2Granted
Lead guides having a recessed face
AssigneeTexas Instruments Incorporated
InventorsChi-Tsung Lee, Ching-Han Chang, Chun-Hsien Lu
Life of this patent
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Abstract
An embodiment includes a first lead guide, a second lead guide, and a handler. The first lead guide includes a first insulating housing and a first conductive contact having a face and a recessed face. The second lead guide includes a second insulating housing and a second conductive contact. The first and second lead guides are fastened to the handler.
Claims26
A system comprising:
- a first lead guide, wherein the first lead guide comprises:
- a first insulating housing having a face and a recessed face, the first insulating housing including a first conductive contact having a face and a recessed face, wherein the face of the first conductive contact is parallel to the face of the first insulating housing, and the recessed face of the first conductive contact is parallel to the recessed face of the first insulating housing;
- a second lead guide, wherein the second lead guide comprises:
- a second insulating housing having a face and a recessed face, the second insulating housing including a second conductive contact having a face and a recessed face, wherein the face of the second conductive contact is parallel to the face of the second insulating housing, and the recessed face of the second conductive contact is parallel to the recessed face of the second insulating housing;
- and
- a handler, wherein the first and second lead guides are fastened to the handler;
- and
- a contactor, wherein the contactor comprises:
- a first set of force pins to contact the face of the first conductive contact, and
- a second set of force pins to contact the face of the second conductive contact.
7 more elements
A method comprising:
- placing, with a handler, a device-under-test (DUT) in contact with a first lead guide and a second lead guide, the first lead guide including a first conductive contact having a face and a recessed face, the second lead guide including a second conductive contact having a face and a recessed face, and the DUT having a first lead and a second lead, wherein placing the DUT in contact with the first and second lead guides comprises placing the first lead in contact with the recessed face of the first conductive contact and placing the second lead in contact with the recessed face of the second conductive contact;
- contacting a first set of force pins with the face of the first conductive contact;
- contacting a first set of sense pins with the first lead;
- contacting a second set of force pins with the face of the second conductive contact;
- and
- contacting a second set of sense pins with the second lead.
3 more elements
A system comprising:
- a device-under-test (DUT) comprising a first lead and a second lead;
- a first lead guide comprising a first conductive contact having a face and a recessed face, wherein the first lead is in contact with the recessed face of the first conductive contact;
- a second lead guide comprising a second conductive contact having a face and a recessed face, wherein the second lead is in contact with the recessed face of the second conductive contact;
- a load-board;
- a first set of force pins in contact with the face of the first conductive contact to electrically couple the load-board to the first lead of the DUT;
- a first set of sense pins in contact with the first lead and electrically coupled to the load-board;
- a second set of force pins in contact with the face of the second conductive contact to electrically couple the load-board to the second lead of the DUT;
- and
- a second set of sense pins in contact with the second lead and electrically coupled to the load-board.
6 more elements
A system comprising:
- a first lead guide comprising a first insulating housing, the first insulating housing comprising a first conductive contact;
- a second lead guide comprising a second insulating housing, the second insulating housing comprising a second conductive contact;
- and
- a contactor comprising a first set of force pins to contact the first conductive contact, and a second set of force pins to contact the second conductive contact, wherein the first set of force pins comprises at least three force pins, and the second set of force pins comprises at least three force pins.
1 more element
A method comprising:
- placing, with a handler, a device-under-test (DUT) in contact with a first lead guide and a second lead guide, the first lead guide comprising a first conductive contact, the second lead guide comprising a second conductive contact, and the DUT comprising a first lead and a second lead, wherein placing the DUT in contact with the first and second lead guides comprises placing the first lead in contact with the first conductive contact and placing the second lead in contact with the second conductive contact;
- contacting a first set of force pins with the first conductive contact, the first set of force pins comprising two force pins;
- contacting a first set of sense pins with the first lead;
- contacting a second set of force pins with the second conductive contact, the second set of force pins comprising two force pins;
- and
- contacting a second set of sense pins with the second lead.
3 more elements
Dependencies are inferred from the claim text.