Method and device for testing wafer, electronic device and storage medium

A method for testing a wafer, the method comprising steps of:

• by one or more processors, obtaining plural test sheets, wherein each test sheet corresponds to at least one wafer to be tested and plural test items;
• by one or more processors, dividing wafers to be tested in the plural test sheets according to individual test items in the plural test sheets, and determining wafers to be tested corresponding to individual divided units, wherein test items of wafers to be tested corresponding to a same divided unit are the same;
• by one or more processors, determining a test sequence of test items to be performed on each wafer to be tested, based on a test sequence condition of the test items in individual test sheets and a test condition of a testing machine corresponding to individual divided units;
• and by one or more processors, testing the wafer to be tested, according to the test sequence of test items to be performed on any of the wafers to be tested, wherein the test sequence condition comprises:
• a site priority of test items, and a creation time priority of individual test sheets, and the test condition comprises:
• machine amount, machine type, and machine idle time;
• and the step of determining the test sequence of test items to be performed on each wafer to be tested, based on the test sequence condition of the test items in individual test sheets and the test condition of a testing machine corresponding to individual divided units comprises:
• using a sorting function to generate the test sequence of the test items of each wafer to be tested, according to the site priority of the test items in individual test sheets, the creation time priority of individual test sheets, and the machine amount, the machine type and the machine idle time of the testing machine corresponding to individual batches.