Probe sheet with contact tip on stacked multi-layer and method of manufacturing the same
AssigneeProtec Mems Technology Inc
InventorsYong Ho Cho, Tae Kyun Kim
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AssigneeProtec Mems Technology Inc
InventorsYong Ho Cho, Tae Kyun Kim
Estimating the term…
Disclosed are a probe sheet with a multi-layer contact tip and a method of manufacturing the same capable of improving the design freedom of a contact tip formed on a probe sheet of a probe card for testing a semiconductor device to come in contact with a pad of the semiconductor device. According to the present invention, the design freedom of a contact tip formed on a probe sheet of a probe card for testing a semiconductor device to come in contact with a pad of the semiconductor device can be improved, and since the shape of a contact surface of a contact tip is maintained the same and contact resistance is maintained in an allowable range even when a protective layer coated on the contact tip to increase durability of the contact tip is worn, test reliability of the probe card can be improved.
A probe sheet with a multi-layer contact tip, the probe sheet comprising:
A method of manufacturing a probe sheet with a multi-layer contact tip, the method comprising:
Dependencies are inferred from the claim text.