System and method for inspecting defects of structure by using X-ray
AssigneeNEUF Inc.
InventorMyoung Chan Na
Life of this patent
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Abstract
A defect inspection system includes an X-ray generator that generates X-ray to be irradiated to a structure, and an X-ray detector that detects the X-ray generated by the X-ray generator and transmitted through the structure. In particular, the X-ray generator is configured to be moved by a first transporting means, and the X-ray detector is configured to be moved by a second transporting means. The system further includes a control unit configured to control and operate the first transporting means and the second transporting means.
Claims11
A method of detecting a defect in a structure using a system comprising an X-ray generator and an X-ray detector, the method comprising:
- dividing virtually, by a controller, the structure into a plurality of sections based on a thickness of the structure;
- receiving, by the controller, a location of the X-ray generator;
- generating, by the X-ray generator, X-ray and irradiating to the structure;
- and
- detecting, by the X-ray detector, the X-ray generated by the X-ray generator and transmitted through the structure,
- wherein, the controller is configured to control output of the X-ray generator based on the thickness of the structure corresponding to the location of the X-ray generator relative to the plurality of sections.
Dependencies are inferred from the claim text.