Particle measuring device and particle measuring method
AssigneeRion Co., Ltd.
InventorsMitsuaki Saito, Reiko Sugahara, Yuka Yoshikawa
Life of this patent
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AssigneeRion Co., Ltd.
InventorsMitsuaki Saito, Reiko Sugahara, Yuka Yoshikawa
Estimating the term…
A particle measuring device includes: a detection unit that detects scattered light generated due to interaction between a particle contained in a liquid sample and light incident thereon, and converts the detected scattered light into a signal; an addition unit that performs a predetermined number of parallel processing on the signal to add the predetermined number of uncorrelated noises thereto and outputs the resulting signals; a binarization unit that binarizes the resulting signals using a binarization threshold set in accordance with the liquid sample, and outputs the binarized signals; a calculation unit that calculates and outputs a value based on the binarized signals; a filter unit that passes a predetermined frequency component of the output of the calculation unit; and a determination unit that determines that the particle is present when an output of the filter unit exceeds a predetermined particle threshold.
A particle measuring device comprising;
A particle measuring method comprising:
A non-transitory computer readable medium encoded with a signal processing program for measuring a particle included in a liquid sample, that is to be executed by a computer including a processor coupled to a memory storing instructions to permit the processor to function as:
Dependencies are inferred from the claim text.