Luminous flux test circuitry, test method and display panel

A luminous flux test circuitry, comprising two test sub-circuitries, a control sub-circuitry and a light-shielding pattern, wherein each of the two test sub-circuitries comprises N photosensitive transistors, where N is a positive integer greater than or equal to 1;

• an output end of each of the N photosensitive transistors in a first test sub-circuitry of the two test sub-circuitries is coupled to a first input end of the control sub-circuitry;
• an output end of each of the N photosensitive transistors in a second test sub-circuitry of the two test sub-circuitries is coupled to a second input end of the control sub-circuitry;
• the light-shielding pattern covers the N photosensitive transistors in the second test sub-circuitry;
• at a sampling stage, the N photosensitive transistors in each test sub-circuitry are in a reverse bias state;
• and
• the control sub-circuitry is configured to determine luminous flux detected by the N photosensitive transistors in the first test sub-circuitry in accordance with a leakage current generated by the N photosensitive transistors in each test sub-circuitry.