Measuring apparatus, on-chip instrumentation device and measuring method
AssigneeNippon Telegraph and Telephone Corporation
InventorsKatsumasa Yoshioka, Masayuki Hashisaka, Koji Muraki, Norio Kumada
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AssigneeNippon Telegraph and Telephone Corporation
InventorsKatsumasa Yoshioka, Masayuki Hashisaka, Koji Muraki, Norio Kumada
Estimating the term…
This application discloses a measurement apparatus that does not use a femtosecond laser light source and a delay stage. The measurement apparatus mixes a first laser light from a first CW laser light source and a second laser light from a second CW laser light source to generate an interference light having a beat in a range from GHz to THz and demultiplexes the interference light into a pump light and a probe light. A generating photoconductive antenna is irradiated with the pump light, and a detecting photoconductive antenna is irradiated with the probe light. A current value of an electromagnetic wave propagating through a waveguide connecting the generating photoconductive antenna and the detecting photoconductive antenna is measured using a current system connected to the detecting photoconductive antenna.
A measurement apparatus comprising:
An on-chip measurement device comprising:
A measurement method comprising:
Dependencies are inferred from the claim text.