Method for monitoring process conditions of, and method for controlling, a plasma PVD process
AssigneeIonautics AB
InventorsDaniel Lundin, Ulf Helmersson
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AssigneeIonautics AB
InventorsDaniel Lundin, Ulf Helmersson
Estimating the term…
A method (200) for monitoring process conditions in a plasma PVD process as well as a method (300) for controlling a plasma PVD process are disclosed. The methods are performed in an apparatus (1) configured therefore. In accordance with the methods, an oscillating voltage signal is applied to a target (3), arranged in the apparatus (1), by means of a radio frequency generator 15). The response from the applied oscillating voltage signal is recorded by means of a radio frequency sensor (16). Based on the recorded response, information regarding at least one plasma process condition is derived. A computer program and a computer-readable medium are also disclosed.
A method for monitoring process conditions in a plasma PVD process, the plasma PVD process performed in an apparatus comprising:
A plasma PVD process apparatus, comprising:
A method for monitoring process conditions in a plasma PVD process, the plasma PVD process performed in an apparatus comprising:
Dependencies are inferred from the claim text.