Plated steel sheet

A plated steel sheet comprising a plated layer on a surface of a steel sheet, wherein the plated layer has an average chemical composition comprising, in mass %,

• Al:
• more than 15.0% and 30.0% or less,
• Mg:
• more than 5.0% and 15.0% or less,
• Sn:
• 0 to 0.70%,
• Bi:
• 0 to 0.35%,
• In:
• 0 to 0.35%,
• Ca:
• 0.03 to 0.60%,
• Y:
• 0 to 0.30%,
• La:
• 0 to 0.30%,
• Ce:
• 0 to 0.30%,
• Si:
• 0.01 to 0.75%,
• Cr:
• 0 to 0.25%,
• Ti:
• 0 to 0.25%,
• Ni:
• 0 to 1.00%,
• Co:
• 0 to 0.25%,
• V:
• 0 to 0.25%,
• Nb:
• 0 to 0.25%,
• Cu:
• 0 to 0.25%,
• Mn:
• 0 to 0.25%,
• Fe:
• 0 to 5.0%,
• Sr:
• 0 to 0.5%,
• Sb:
• 0 to 0.5%,
• Pb:
• 0 to 0.5%,
• B:
• 0 to 0.5%,
• Li:
• 0 to 0.5%,
• Zr:
• 0 to 0.5%,
• Mo:
• 0 to 0.5%,
• W:
• 0 to 0.5%,
• Ag:
• 0 to 0.5%,
• P:
• 0 to 0.5%, and
• a remainder of Zn and impurities,
• a total amount ΣA of Sn, Bi and In is 0% or more and less than 0.75%,
• a total amount ΣB of Ca, Y, La, and Ce is 0.03 to 0.60%,
• a total amount ΣC of Cr, Ti, Ni, Co, V, Nb, Cu, and Mn is 0 to 1.00%,
• Sn≤Si and 20.0≤Mg/Si are satisfied, and
• when I1 to I3 determined from X-ray diffraction peaks of Al2.15Zn1.85Ca, 14 determined from an X-ray diffraction peak of CaZn2, and 15 and 16 determined from X-ray diffraction peaks of η′-MgZn2 are defined by the following Formulas (1) to (6) in an X-ray diffraction pattern of a surface of the plated layer, measured under conditions of an X-ray output of 40 kV and 150 mA using a Cu-Kα ray, the following Formulas (A) and (B) are satisfied:
• I
• 1
• =
• I
• ⁢
• max
• ⁡
• (
• 2
• ⁢
• 2
• .
• 5
• ⁢
• 4
• ∼
• 23.3
• °
• )
• I
• ⁡
• (
• 22.54
• °
• )
• +
• 0
• .
• 4
• ⁢
• 74
• ⁢
• {
• ❘
• "\[LeftBracketingBar]"
• I
• ⁡
• (
• 23.3
• °
• )
• -
• I
• ⁡
• (
• 22.54
• °
• )
• ❘
• "\[RightBracketingBar]"
• }
• (
• 1
• )
• I
• 2
• =
• I
• ⁢
• max
• ⁡
• (
• 3
• ⁢
• 1
• .
• 0
• ⁢
• 0
• ∼
• 32.
• °
• )
• I
• ⁡
• (
• 31.
• °
• )
• +
• 0
• .
• 6
• ⁢
• 2
• ⁢
• {
• ❘
• "\[LeftBracketingBar]"
• I
• ⁡
• (
• 32.
• °
• )
• -
• I
• ⁡
• (
• 31.
• °
• )
• ❘
• "\[RightBracketingBar]"
• }
• (
• 2
• )
• I
• 3
• =
• I
• ⁢
• max
• ⁡
• (
• 4
• ⁢
• 3
• .
• 8
• ⁢
• 0
• ∼
• 44.3
• °
• )
• I
• ⁡
• (
• 43.5
• °
• )
• +
• 0.48
• {
• ❘
• "\[LeftBracketingBar]"
• I
• ⁡
• (
• 44.3
• °
• )
• -
• I
• ⁡
• (
• 43.8
• °
• )
• ❘
• "\[RightBracketingBar]"
• }
• (
• 3
• )
• I
• 4
• =
• I
• ⁢
• max
• ⁡
• (
• 3
• ⁢
• 3
• .
• 0
• ⁢
• 0
• ∼
• 33.8
• °
• )
• I
• ⁡
• (
• 33.
• °
• )
• +
• 0
• .
• 4
• ⁢
• 3
• ⁢
• 75
• ⁢
• {
• ❘
• "\[LeftBracketingBar]"
• I
• ⁡
• (
• 33.8
• °
• )
• -
• I
• ⁡
• (
• 33.
• °
• )
• ❘
• "\[RightBracketingBar]"
• }
• (
• 4
• )
• I
• 5
• =
• I
• ⁢
• max
• ⁡
• (
• 26.
• ∼
• 26.4
• °
• )
• I
• ⁡
• (
• 26.
• °
• )
• +
• 0
• .
• 3
• ⁢
• 75
• ⁢
• {
• ❘
• "\[LeftBracketingBar]"
• I
• ⁡
• (
• 26.4
• °
• )
• -
• I
• ⁡
• (
• 26.
• °
• )
• ❘
• "\[RightBracketingBar]"
• }
• (
• 5
• )
• I
• 6
• =
• I
• ⁢
• max
• ⁡
• (
• 4
• ⁢
• 9
• .
• 0
• ⁢
• 0
• ∼
• 49.6
• °
• )
• I
• ⁡
• (
• 49.
• °
• )
• +
• 0
• .
• 3
• ⁢
• 67
• ⁢
• {
• ❘
• "\[LeftBracketingBar]"
• I
• ⁡
• (
• 49.6
• °
• )
• -
• I
• ⁡
• (
• 49.
• °
• )
• ❘
• "\[RightBracketingBar]"
• }
• (
• 6
• )
• 4.05
• ≤
• I
• 1
• +
• I
• 2
• +
• I
• 3
• +
• I
• 4
• (
• A
• )
• 2.05
• ≤
• I
• 5
• +
• I
• 6
• (
• B
• )
• wherein, in Formulas (1) to (6), Imax (k to m°) is a maximum value of an X-ray diffraction intensity at a diffraction angle 2θ between k to m°, I (n°) is an X-ray diffraction intensity at a diffraction angle 2θ of n°, and k, m, and n are diffraction angles 2θ each shown in Formulas (1) to (6).