Back to results
US 12,123,745 B2Granted
Device for measuring various properties of coatings and materials and methods of using the same
AssigneeWood Coatings Research Group, Inc.
InventorsRonald Todd Obie, Cameron Ramil Anderson
Life of this patent
Estimating the term…
Abstract
Provided are material testing devices and methods for measuring certain physical properties of materials, such as for example, drying, curing, film formation, friction, adhesion, print resistance, and scratch resistance. The testing device includes a platform, a stylus comprising a probe, an angle sensor, a linear position sensor, a control system with a power supply and a control center which may be programmed with testing parameters.
Claims17
A material testing device, comprising:
- a platform configured to support a material to be tested;
- a drive system and/or a motor configured to move the platform in one or both of X and Y directions;
- a probe;
- a stylus configured to support the probe;
- wherein the probe configured to contact the material to be tested when a load is imposed on the stylus and the probe;
- an angle sensor configured to measure the angle of the probe relative to the platform;
- a linear position sensor configured to measure the position of the platform relative to the probe;
- a control system comprising a control center configured to be programmed with a set of testing parameters;
- wherein the platform is configured to move in one or both of the X and Y direction relative to the probe in response to commands received from the control system based on the set of testing parameters.
6 more elements
A method of using a testing device to measure a property of a material, comprising:
- (a) programming a control center of the testing device with a set of testing parameters;
- (b) positioning a substrate comprising a material onto a platform of the testing device;
- (c) bringing a probe of the testing device into contact with the material;
- (d) applying a vertical load to the probe using a load generating device such that a force is imparted on the material;
- (e) moving the platform relative to the force applied to the probe;
- and
- (f) sensing a height of the probe relative to the substrate;
- wherein the testing device further comprises an angle sensor configured to measure the angle of the probe relative to the platform;
- a linear position sensor configured to measure the position of the platform relative to the probe;
- and a control system comprising a power supply and the control center;
- (g) measuring the angle of the movement of the probe;
- and
- (h) converting the angle measurement to a linear measurement.
10 more elements
Dependencies are inferred from the claim text.