Memory device and operation method thereof
AssigneeSamsung Electronics Co., Ltd.
InventorsSang-Wan Nam, Hyunggon Kim, Bong-Kil Jung, Younho Hong, Juseong Hwang
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AssigneeSamsung Electronics Co., Ltd.
InventorsSang-Wan Nam, Hyunggon Kim, Bong-Kil Jung, Younho Hong, Juseong Hwang
Estimating the term…
Disclosed is a memory device includes a memory block that is connected with a plurality of wordlines, a voltage generating circuit configured to output a first non-selection voltage through a plurality of driving lines, and an address decoding circuit configured to connect the plurality of driving lines with unselected wordlines of the plurality of wordlines. During a wordline setup period for the plurality of wordlines, the voltage generating circuit floats first driving lines corresponding to first unselected wordlines of the unselected wordlines from among the plurality of driving lines when the first unselected wordlines reach a first target level, and floats second driving lines corresponding to second unselected wordlines of the unselected wordlines from among the plurality of driving lines when the second unselected wordlines reach a second target level different from the first target level.
A memory device comprising;
A memory device comprising:
An operation method of a memory device which includes a memory block connected with a plurality of wordlines, the method comprising:
Dependencies are inferred from the claim text.