Predictive process control for a manufacturing process
AssigneeNanotronics Imaging, Inc.
InventorsMatthew C. Putman, John B. Putman, Vadim Pinskiy, Damas Limoge
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AssigneeNanotronics Imaging, Inc.
InventorsMatthew C. Putman, John B. Putman, Vadim Pinskiy, Damas Limoge
Estimating the term…
Aspects of the disclosed technology encompass the use of a deep-learning controller for monitoring and improving a manufacturing process. In some aspects, a method of the disclosed technology includes steps for: receiving control values associated with a process station in a manufacturing process, predicting an expected value for an article of manufacture output from the process station, and determining if the deep-learning controller can control the manufacturing process based on the expected value. Systems and computer-readable media are also provided.
A computer-implemented method for detecting unexpected activity in a manufacturing process executed in a manufacturing system comprising a plurality of process stations, the computer-implemented method comprising:
A system comprising:
A non-transitory computer readable medium comprising one or more sequences of instructions, which, when executed by a processor, causes a computing system to perform operations comprising:
Dependencies are inferred from the claim text.