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US 12,113,650 B2Granted
Semiconductor apparatus including calibration circuit
AssigneeSK hynix Inc.
InventorsJung Hyun Shin, Yongsuk Choi
Life of this patent
Estimating the term…
Abstract
A semiconductor apparatus includes a calibration circuit, a selection circuit, and a data circuit. The calibration circuit generates a plurality of calibration signals by being coupled to a plurality of reference resistors. The selection circuit selects at least one signal among the plurality of calibration signals on the basis of an impedance setting signal. The data circuit sets an impedance based on the selected calibration signal.
Claims18
A semiconductor apparatus comprising:
- a based chip;
- and
- a first core chip stacked on the base chip and coupled to the base chip,
- wherein the base chip comprises:
- a calibration circuit configured to generate a plurality of calibration signals by being coupled to a plurality of reference resistors and performing calibration operations;
- a first control circuit configured to select one of the plurality of calibration signals based on a first impedance setting signal to generate a first impedance control signal;
- and
- a first data circuit configured to receive first data from the first core chip and transmit the first data to an external device, or configured to receive the first data from the external device and transmit the first data to the first core chip, and configured to set an impedance based on the first impedance control signal.
5 more elements
A semiconductor apparatus comprising:
- a based chip;
- and
- a first core chip stacked on the base chip and coupled to the base chip,
- wherein the base chip comprises a first data circuit configured to receive first data from the first core chip and transmit the first data to an external device, or configured to receive the first data from the external device and transmit the first data to the first core chip,
- wherein the base chip is configured to generate a plurality of calibration signals, which has different logic values, by performing calibration operations, and to generate a first impedance control signal by selecting one of the plurality of calibration signals based a first impedance setting signal,
- wherein the first data circuit is configured to set an impedance based on the first impedance control signal.
3 more elements
A semiconductor apparatus comprising:
- a base chip;
- and
- a first core chip stacked on the base chip, coupled to the base chip, and forming a first channel and a second channel;
- wherein the base chip comprises:
- a calibration circuit configured to generate a plurality of calibration signals, which has different logic values, by performing calibration operations;
- a control circuit configured to generate a first impedance control signal by selecting one of the plurality of calibration control signals based on a first impedance setting signal, and to generate a second impedance control signal by selecting one of the plurality of calibration control signals based on a second impedance setting signal;
- a first channel data circuit configured to receive first channel data from the first core chip and transmit the first channel data to an external device, or configured to receive the first channel data from the external device and transmit the first channel data to the first core chip, and to set an impedance based on the first impedance setting signal;
- and
- a second channel data circuit configured to receive second channel data from the first core chip and transmit the second channel data to the external device, or configured to receive the second channel data from the external device and transmit the second channel data to the first core chip, and to set an impedance based on the second impedance setting signal.
6 more elements
Dependencies are inferred from the claim text.