Substrate processing system, load port and method
AssigneesTaiwan Semiconductor Manufacturing Company, Ltd., Tsmc China Company Limited
InventorsChuang Li, Honghua Zhu
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AssigneesTaiwan Semiconductor Manufacturing Company, Ltd., Tsmc China Company Limited
InventorsChuang Li, Honghua Zhu
Estimating the term…
A system includes at least one sensor and at least one controller. The at least one sensor is configured to generate a first weight signal corresponding to a first weight of a first lot of substrates, and a second weight signal corresponding to a second weight of a second lot of substrates. The at least one controller is coupled to the at least one sensor to receive the first weight signal and the second weight signal. The at least one controller is configured to convert a weight difference between the first weight and the second weight into a number of substrates each having a predetermined weight. The at least one controller is further configured to, based on the converted number of substrates, control a processing apparatus to rotate the first lot of substrates and the second lot of substrates simultaneously.
A system, comprising:
A load port for a wafer processing system, the load port comprising:
A method, comprising:
Dependencies are inferred from the claim text.