Back to results
US 12,112,943 B2Granted
Method for forming film and processing apparatus
AssigneeTokyo Electron Limited
InventorsKeita Kumagai, Hiroto Fujikawa, Ryo Watanabe
Life of this patent
Estimating the term…
Abstract
A method for forming a film that includes forming a boron nitride film on a substrate, and forming a boron-containing silicon film on the boron nitride film.
Claims5
A method for forming a film, the method comprising:
- forming a boron nitride film on a substrate, and
- forming a boron-containing silicon film on the boron nitride film,
- wherein a ratio of elements of boron (B) and nitrogen (N) in the boron nitride film is B:50% and N:50%, and
- wherein the forming of the boron nitride film is performed under conditions that a 10% B2H6/H2 gas flow rate is 700 sccm;
- an NH3 gas flow rate is 100 sccm;
- a film-forming temperature is 300° C.;
- and a processing chamber pressure is 0.5 Torr (66.7 Pa), and then the forming of the boron-containing silicon film on the boron nitride film is performed under conditions that a 10% B2H6/H2 gas flow rate is 800 sccm;
- a SiH4 gas flow rate is 666 sccm;
- a film-forming temperature is 250° C.;
- and a processing chamber pressure is 0.5 Torr (66.7 Pa).
7 more elements
Dependencies are inferred from the claim text.