Test method, computer apparatus, and computer-readable storage medium
AssigneeChangxin Memory Technologies, Inc.
InventorBiao Song
Life of this patent
Estimating the term…
Abstract
Embodiments relate to a test method, a computer apparatus, and a computer-readable storage medium. The test method includes: writing first data into a target memory cell; performing reverse writing on the target memory cell; reading second data stored in the target memory cell after the reverse writing; determining whether the second data are the same as the first data; and determining that write recovery time of the target memory cell fails when the second data are the same as the first data. The present disclosure can make an effective test of determining whether the write recovery time fails.
Claims17
A test method comprising:
- writing first data into a target memory cell;
- performing reverse writing on the target memory cell;
- reading second data stored in the target memory cell after the reverse writing;
- determining whether the second data are the same as the first data;
- and
- determining that write recovery time of the target memory cell fails when the second data are the same as the first data;
- and,
- wherein after the determining that write recovery time of the target memory cell fails when the second data are the same as the first data, the test method further comprises:
- detecting whether there is provided with an isolation layer between a bit line and a bit line contact hole structure of the target memory cell.
A test method comprising:
- writing first data into a target memory cell;
- performing reverse writing on the target memory cell;
- reading second data stored in the target memory cell after the reverse writing;
- determining whether the second data are the same as the first data;
- and
- determining that write recovery time of the target memory cell fails when the second data are the same as the first data;
- wherein after the writing first data into the target memory cell and before the performing reverse writing on the target memory cell, the test method comprises:
- setting CSL ON time less than preset time;
- wherein after the determining whether the second data are the same as the first data, the test method further comprises:
- when the second data are different from the first data, setting the CSL ON time again to shorten the CSL ON time until the second data are the same as the first data, to obtain CSL ON time when the second data are the same as the first data.
Dependencies are inferred from the claim text.