Device for determining read reference voltage of a memory device and operating method thereof

A device comprising:

• a threshold voltage distribution estimation network configured to generate an estimated distribution matrix using a feature distribution matrix and read trial information, the threshold voltage distribution estimation network including a feature distribution generating circuit and a combination circuit, the feature distribution generating circuit configured to generate the feature distribution matrix from a plurality of threshold voltage distributions for a plurality of pages of a memory device, the combination circuit configured to generate the estimation distribution matrix by combining a plurality of vectors included in the feature distribution matrix using a combination coefficient vector;
• and
• a read reference voltage estimation network configured to generate a read reference voltage from the estimated distribution matrix,
• wherein the read trial information includes a read trial vector and an output value, the output value being generated by applying the read trial vector to a threshold voltage distribution for a page to be read among the plurality of threshold voltage distributions, and
• wherein the threshold voltage distribution estimation network further includes a coefficient estimation network configured to generate the combination coefficient vector from the read trial information.