Signal routing between memory die and logic die for mode based operations
AssigneeMicron Technology, Inc.
InventorsAliasger T. Zaidy, Glen E. Hush, Sean S. Eilert, Kunal R. Parekh
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AssigneeMicron Technology, Inc.
InventorsAliasger T. Zaidy, Glen E. Hush, Sean S. Eilert, Kunal R. Parekh
Estimating the term…
A memory device includes a memory die bonded to a logic die. A logic die that is bonded to a memory die via a wafer-on-wafer bonding process can receive signals indicative of input data from a global data bus of the memory die and through a bond of the logic die and memory die. The logic die can also receive signals indicative of kernel data from local input/output (LIO) lines of the memory die and through the bond. The logic die can perform a plurality of operations at a plurality of vector-vector (VV) units utilizing the signals indicative of input data and the signals indicative of kernel data. The inputs and the outputs to the VV units can be configured based on a mode of the logic die.
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Dependencies are inferred from the claim text.