Defect detecting method based on dimensionality reduction of data, electronic device, and storage medium
AssigneeHon Hai Precision Industry Co., Ltd.
InventorsTzu-Chen Lin, Tung-Tso Tsai, Chin-Pin Kuo
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AssigneeHon Hai Precision Industry Co., Ltd.
InventorsTzu-Chen Lin, Tung-Tso Tsai, Chin-Pin Kuo
Estimating the term…
A method for detecting product for defects implemented in an electronic device includes classifying a plurality of product images to be detected into linear images or non-linear images; performing dimension reduction processing on the product images after image classification according to a plurality of dimension reduction algorithms to obtain a plurality of dimension reduction data; determining an optimal dimension reduction data of the plurality of dimension reduction data; obtaining score data of the product image by inputting the optimal dimension reduction data into a Gaussian mixture model; comparing the score data with a threshold; determining whether the score data is less than the threshold; and determining that there is at least one defect in the product image in response that the score data is determined to be less than the threshold.
An electronic device comprising:
A defect detecting method based on dimensionality reduction of data implemented in an electronic device comprising:
A non-transitory storage medium having instructions stored thereon, when the instructions are executed by a processor of an electronic device, the processor is configured to perform a defect detecting method based on dimensionality reduction of data, wherein the method comprises:
Dependencies are inferred from the claim text.