Inspection system, terminal device, inspection method, and non-transitory computer readable storage medium
AssigneeKabushiki Kaisha Yaskawa Denki
InventorsRyo Masumura, Masaru Adachi
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AssigneeKabushiki Kaisha Yaskawa Denki
InventorsRyo Masumura, Masaru Adachi
Estimating the term…
An inspection system includes machine learning circuitry configured to determine whether each of objects belongs to a predetermined attribute based on feature data of each of the objects, feature data acquisition circuitry configured to acquire feature data of reevaluated objects which are determined to belong to the predetermined attribute without using the machine learning circuitry among excluded objects which are determined not to belong to the predetermined attribute by the machine learning circuitry, and parameter update circuitry configured to update a learning parameter of the machine learning circuitry based on teaching data including the acquired feature data acquired by the feature data acquisition circuitry.
An inspection system comprising:
An inspection method comprising:
A non-transitory computer readable storage medium retrievably storing a computer-executable program therein, the computer-executable program causing a computer to perform an inspection method, the inspection method comprising:
Dependencies are inferred from the claim text.