Modular vertical probe card

A modular vertical probe card having different probes, comprising:

• a first guiding board unit and a second guiding board unit that is spaced apart from the first guiding board unit;
• and
• a plurality of conductive probes passing through the first guiding board unit and the second guiding board unit, wherein the conductive probes have a same probe length, and each of the conductive probes has an elongated shape defining a longitudinal direction and includes:
• a stroke segment located between the first guiding board unit and the second guiding board unit;
• and
• a connection segment and a testing segment that are respectively connected to two ends of the stroke segment and that respectively pass through the first guiding board unit and the second guiding board unit;
• wherein the stroke segments of the conductive probes have N number of shapes different from each other to be configured to meet N number of electrical transmission requirements different from each other while allowing the conductive probes to have a same contact force, and wherein N is a positive integer greater than one;
• wherein the conductive probes include:
• a rectangular probe not having any thru-hole formed in the stroke segment thereof;
• and
• a first probe having a first penetrating slot formed in the stroke segment thereof along the longitudinal direction, wherein the stroke segment of the first probe has two first arms respectively arranged at two opposite sides of the first penetrating slot;
• wherein along a direction perpendicular to the longitudinal direction, a cross-sectional area of the stroke segment of the rectangular probe is equal to a sum of smallest cross-sectional areas of the two first arms of the first probe.