X-ray scanning system and method for inspecting an object
AssigneeSeethru Ai Inc.
InventorOmar Al-Kofahi
Life of this patent
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AssigneeSeethru Ai Inc.
InventorOmar Al-Kofahi
Estimating the term…
Presently disclosed is an x-ray scanning system and method for inspecting an object. The system has a first mobile x-ray scanner configured for scatter imaging and to generate a first compilation of scan data of a first side of the object. A second x-ray scanner is configured for imaging and generating a second compilation of scan data of a second side of the object. A movement device is configured and disposed to move at least one of the first scanner, the second scanner, and the object being scanned, during the scanning of the object. A data integrator is configured and disposed to receive and integrate the first compilation of scan data and the second compilation of scan data.
An x-ray scanning system for inspecting an object, the system comprising:
A method of x-ray scanning and inspecting an object, the method comprising:
A data integrator configured and disposed to integrate a first compilation of scan data and a second compilation of scan data, the data integrator comprising:
Dependencies are inferred from the claim text.