Apparatus and method for inspecting an object

An apparatus for inspecting an object, where the object is made up of a first layer of plastic material and a second layer of EVO or EVOH and has a base wall and a side wall which is inclined relative to the base wall, the apparatus comprising:

• an inspection zone in which the object can be placed for inspection;
• a conveyor for feeding the object to the inspection zone along a feed plane;
• an imaging device configured to view the object positioned in the inspection zone, to capture infrared rays having a wavelength of between 2 μm and 5 μm and to generate an image of the object as a function of the infrared rays;
• a processor, connected to the imaging device to receive the images generated and configured to process the images, to inspect the second layer;
• a thermal conditioning system including a thermometer, configured to measure the temperature of the inspection zone, and a control unit, configured to compare the temperature of the inspection zone with a reference temperature and to generate thermal conditioning signals as a function of the comparison, and
• a deflecting system configured to divert the infrared rays that do not fall within a field of vision of the imaging device and direct them into the field of vision of the imaging device, thus allowing them to be captured by the imaging device.

A method for inspecting an object, where the object is made up of a first layer of plastic material and a second layer of EVO or EVOH and has a base wall and a side wall which is inclined relative to the base wall, the method comprising the following steps:

• feeding the object to an inspection zone along a feed plane, wherein the base wall of the object is disposed in the inspection zone according to a predetermined orientation relative to the feed plane;
• capturing infrared rays having a wavelength of between 2 μm and 5 μm, using an imaging device;
• generating an image of the object as a function of the infrared radiation captured;
• processing the image, using a processor, to inspect the second layer of the object, and
• a deflecting step, wherein the imaging device is oriented along an inspection axis and wherein infrared rays emitted by the side wall of the object are diverted so as to reduce their inclination relative to the inspection axis.