Method and system for measuring refractive index of particle sample by using polarization difference of scattered light distribution

Abstract

A method and system for measuring a refractive index of a particle sample by using a polarization difference of scattered light distribution. The method comprises: acquiring a vertically polarized scattered light energy distribution E⊥ and a horizontally polarized scattered light energy distribution E∥, and calculating a scattered light energy distribution polarization difference Ed; according to Mie theory, calculating a vertically polarized scattered light energy matrix (aa) and a scattered light polarization difference matrix (bb) with k×l dimensions under a supposed refractive index value of n(i); calculating a particle size distribution W(i) of a measured particle; acquiring a polarization difference of scattered light distribution (cc); calculating a RMS error σ(j) of Ed and (cc); changing the refractive index value; and repeating the process over and over until finding a refractive index value with the smallest RMS error, wherein the refractive index is the true refractive index of the particle sample.

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