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US 12,110,047 B2Granted
Information processing apparatus and method
AssigneeKabushiki Kaisha Toshiba
InventorsSayaka Akiyama, Toru Yano
Life of this patent
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Abstract
According to one embodiment, an information processing apparatus includes a processor. The processor is configured to detect a state of a device by applying device information on the device to a state detection model generated based on past device information on the device and characteristic information indicating characteristics of a moving body equipped with the device.
Claims9
An information processing apparatus, comprising:
- processing circuitry configured to detect a state of a device by applying device information on the device to a state detection model generated based on past device information on the device and characteristic information indicating characteristics of a moving body equipped with the device,
- wherein the processing circuitry is further configured to select the state detection model from a plurality of state detection models, based on a calculated reliability of each of the plurality of state detection models, the reliability being calculated, for each model of the plurality of state detection models, by
- (1) determining a first value indicating a number of times for which the model output a value indicating a failure of the device that occurred during a predetermined past time period,
- (2) determining a second value indicating a number of actual failures that occurred for the device in the predetermined past time period,
- (3) determining an accuracy by multiplying a state change amount by the determined first value and dividing by the determined second value,
- (4) determining a learning validity value, which is zero when a failure case occurred during a training period of the model and is one when the failure case did not occur during the training period, and
- (5) determining the reliability by multiplying the determined accuracy by the determined learning validity value.
4 more elements
An information processing apparatus, comprising:
- processing circuitry configured to
- input first and second periods designated by a user;
- and
- display a state of a device detected by applying device information on the device during the first period to a state detection model generated based on device information on the device during the second period,
- wherein the processing circuitry is further configured to select the state detection model from a plurality of state detection models, based on a calculated reliability of each of the plurality of state detection models, the reliability being calculated, for each model of the plurality of state detection models, by
- (1) determining a first value indicating a number of times for which the model output a value indicating a failure of the device that occurred during a predetermined past time period,
- (2) determining a second value indicating a number of actual failures that occurred for the device in the predetermined past time period,
- (3) determining an accuracy by multiplying a state change amount by the determined first value and dividing by the determined second value,
- (4) determining a learning validity value, which is zero when a failure case occurred during a training period of the model and is one when the failure case did not occur during the training period, and
- (5) determining the reliability by multiplying the determined accuracy by the determined learning validity value.
7 more elements
A method, comprising:
- detecting, by processing circuitry, a state of a device by applying device information on the device to a state detection model generated based on past device information on the device and characteristic information indicating characteristics of a moving body equipped with the device,
- wherein the method further comprises selecting, by the processing circuitry, the state detection model from a plurality of state detection models, based on a calculated reliability of each of the plurality of state detection models, the reliability being calculated, for each model of the plurality of state detection models, by
- (1) determining a first value indicating a number of times for which the model output a value indicating a failure of the device that occurred during a predetermined past time period,
- (2) determining a second value indicating a number of actual failures that occurred for the device in the predetermined past time period,
- (3) determining an accuracy by multiplying a state change amount by the determined first value and dividing by the determined second value,
- (4) determining a learning validity value, which is zero when a failure case occurred during a training period of the model and is one when the failure case did not occur during the training period, and
- (5) determining the reliability by multiplying the determined accuracy by the determined learning validity value.
4 more elements
Dependencies are inferred from the claim text.