Failure detection and correction for LED arrays

An error correction method for a micro light-emitting diode (μLED) die, the method comprising:

• post processing received image data to be displayed by a μLED array of the μLED die resulting in processed image data including an expected output current;
• transferring the processed image data to an input frame buffer;
• activating the μLED array in accord with the processed image data in the input frame buffer;
• determining actual electrical activity of one or more μLEDs of the μLED array including an actual output current;
• transferring the actual electrical activity to a return frame buffer;
• comparing the actual electrical activity from the return frame buffer to expected electrical activity, the expected electrical activity determined based on the processed image data in the input frame buffer;
• and
• using an image post processor to modify next image data to compensate for differences between the expected electrical activity and the actual electrical activity.

A micro light-emitting diode (μLED) array system, the system comprising:

• an image post processor configured to translate received image data to at least one parameter selected from parameters including pulse width modulation (PWM) and analog pixel current control data;
• a μLED die comprising:
• an input frame buffer configured to receive the control data and expected output current;
• a plurality of individually controllable μLEDS of a μLED array;
• a plurality of μLED drivers configured to drive respective μLEDs based on the control data;
• and
• a return frame buffer that is configured to receive data indicating a μLED electrical output characteristic including an actual output current;
• and
• compare circuitry configured to compare the expected output current and the actual output current from the input and return frame buffers, respectively, and transfer comparison data to the image post processor, the image post processor configured to alter individual PWM on at least one parameter selected from parameters including time and analog pixel current based on the comparison data.