Back to results
US 12,015,470 B2Granted
Timing measurement method and related device
AssigneeHuawei Technologies Co., Ltd.
InventorsFan Zhang, Yuzhou Wang
Life of this patent
Estimating the term…
Abstract
Example timing measurement methods and apparatus are described. One example method includes that user equipment receives M beams from a base station, where M is a positive integer. The user equipment performs timing measurement on N beams in the M beams, where the N beams are selected from the M beams based on reference signal received powers (RSRPs) of the M beams, and N is a positive integer less than or equal to M.
Claims6
A timing measurement method, wherein the method comprises:
- receiving, by user equipment, M beams from a base station, wherein M is a positive integer;
- performing, by the user equipment, timing measurement on N beams in the M beams, wherein the N beams are selected from the M beams based on reference signal received powers (RSRPs) of the M beams, and wherein N is a positive integer less than or equal to M;
- and
- determining, by the user equipment, a timing position for a received signal based on a weight of power delay profiles of the N beams, wherein the power delay profiles are obtained through timing measurement.
1 more element
A device, comprising:
- at least one processor;
- and
- one or more memories coupled to the at least one processor and storing programming instructions for execution by the at least one processor to:
- receive M beams from a base station, wherein M is a positive integer;
- perform timing measurement on N beams in the M beams, wherein the N beams are selected from the M beams based on reference signal received powers (RSRPs) of the M beams, and wherein N is a positive integer less than or equal to M;
- and
- determine a timing position for a received signal based on a weight of power delay profiles of the N beams, wherein the power delay profiles are obtained through timing measurement.
4 more elements
Dependencies are inferred from the claim text.